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근거리 디스플레이 측정을 위한
NED 측정기(NED M-Series, W-Series)
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최대 150도의 넓은 화각으로 ARVR측정을 위한 One Shot 측정 장비
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생산 라인 적용에 특화되어 빠른 측정 시간과 안정적인 내구성을 제공
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고성능의 스펙트로미터와 함께 결합할 수 있는 2D 면 계측 장비
Product Family
M80
M150
System Specification
Luminance test range
0.1 - 25K cd/m2
0.1 - 25K cd/m2
Dynamic Range Extension
Built-in ND filter
Built-in ND filter
Image Sensor Interface
CoaXPress V1.1.1 CXP3/6 - 4 lanes
CoaXPress V1.1.1 CXP3/6 - 4 lanes
Lens Front Barrel Diameter
52 mm
54 mm
Control Interface
USB 2.0, USB 2.0 over Ethernet (optional)
USB 2.0, USB 2.0 over Ethernet (optional)
Input Power
110 - 240V AC, 50-60Hz 2.5A
110 - 240V AC, 50-60Hz 2.5A
Dimensions (L x W x H)
317 x 230 x 470 mm
317 x 230 x 596 mm
Environmental
15 to 35ºC, relative humidoty 70 %
or less without condensation
15 to 35ºC, relative humidoty 70 %
or less without condensation
Optical Specification - M80 or W150 Imaging Colorimeter Only
Image Sensor
CMOS, Global Shutter, 65 MegaPixels, TE Cooled
CMOS, Global Shutter, 65 MegaPixels, TE Cooled
Active Image (H x V)
9,344 (H) x 7,000 (V)
9,344 (H) x 7,000 (V)
Pixel Size (μm)
3.2 x 3.2 μm
3.2 x 3.2 μm
Field of View (H x V)
116 x 95 deg.
150 deg. Diagonal
Angular Pixel Density
60 pixels/deg, constant across the FOV
60 pixels/deg, constant across the FOV
Distortion
< 1 %
< 1 %
Autofocus Range
0 to 4 Diopters
Infinity to 250 mm
Luminance Measurement Range
0.2 cd/m2 to 5000,000 cd/m2
0.2 cd/m2 to 5000,000 cd/m2
Luminance Accuracy
±2 %
±2 %
Luminance Repeatability (2σ)
0.002
0.002
Color Accuracy
±0.003 in CIE 1931 x,y for white
±0.003 in CIE 1931 x,y for white
Color Repeatability (2σ)
0.0005 in CIE 1931 x,y for white
0.0005 in CIE 1931 x,y for white
Flicker Measurement
Built-in sensor with FBW 80k Hz (@ -3 dB)
Built-in sensor with FBW 80k Hz (@ -3 dB)
Optical Specification - M80 or W150 Imaging Colorimeter + optional Spectroradiometer
Luminance Accuracy
±1 %
±1 %
Luminance Repeatability
0.002
0.002
Color Accuracy
±0.0015 in CIE 1931 x,y
±0.0015 in CIE 1931 x,y
Color Repeatability
0.0005 in CIE 1931 x,y
0.0005 in CIE 1931 x,y
Wavelength Range (nm)
400 to 780
400 to 780
Wavelength Data Increment (nm)
1nm (with spectrometer)
1nm (with spectrometer)
Wavelength Reproducibility
±1 nm (with spectrometer)
±1 nm (with spectrometer)
Polarization Sensitivity
< 3 %
< 3 %
Software Measurement Capabilities
- Center Color & Luminance
- Field of View
- Luminance Uniformity
- Color Uniformity
- Michelson Contrast & Uniformity
- Image Geometric Distortion
- Checkerboard & ANSI Contrast
- Sequential Contrast
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