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NED 측정기(NED M-Series, W-Series)

근거리 디스플레이 측정을 위한

NED 측정기(NED M-Series, W-Series)

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  • 최대 150도의 넓은 화각으로 ARVR측정을 위한 One Shot 측정 장비

  • 생산 라인 적용에 특화되어 빠른 측정 시간과 안정적인 내구성을 제공

  • 고성능의 스펙트로미터와 함께 결합할 수 있는 2D 면 계측 장비

제품 사양

Product Family

M80

M150

System Specification

Luminance test range

0.1 - 25K cd/m2

0.1 - 25K cd/m2

Dynamic Range Extension

Built-in ND filter

Built-in ND filter

Image Sensor Interface

CoaXPress V1.1.1 CXP3/6 - 4 lanes

CoaXPress V1.1.1 CXP3/6 - 4 lanes

Lens Front Barrel Diameter

52 mm

54 mm

Control Interface

USB 2.0, USB 2.0 over Ethernet (optional)

USB 2.0, USB 2.0 over Ethernet (optional)

Input Power

110 - 240V AC, 50-60Hz 2.5A

110 - 240V AC, 50-60Hz 2.5A

Dimensions (L x W x H)

317 x 230 x 470 mm

317 x 230 x 596 mm

Environmental

15 to 35ºC, relative humidoty 70 %
or less without condensation

15 to 35ºC, relative humidoty 70 %
or less without condensation

Optical Specification - M80 or W150 Imaging Colorimeter Only

Image Sensor

CMOS, Global Shutter, 65 MegaPixels, TE Cooled

CMOS, Global Shutter, 65 MegaPixels, TE Cooled

Active Image (H x V)

9,344 (H) x 7,000 (V)

9,344 (H) x 7,000 (V)

Pixel Size (μm)

3.2 x 3.2 μm

3.2 x 3.2 μm

Field of View (H x V)

116 x 95 deg.

150 deg. Diagonal

Angular Pixel Density

60 pixels/deg, constant across the FOV

60 pixels/deg, constant across the FOV

Distortion

< 1 %

< 1 %

Autofocus Range

0 to 4 Diopters

Infinity to 250 mm

Luminance Measurement Range

0.2 cd/m2 to 5000,000 cd/m2

0.2 cd/m2 to 5000,000 cd/m2

Luminance Accuracy

±2 %

±2 %

Luminance Repeatability (2σ)

0.002

0.002

Color Accuracy

±0.003 in CIE 1931 x,y for white

±0.003 in CIE 1931 x,y for white

Color Repeatability (2σ)

0.0005 in CIE 1931 x,y for white

0.0005 in CIE 1931 x,y for white

Flicker Measurement

Built-in sensor with FBW 80k Hz (@ -3 dB)

Built-in sensor with FBW 80k Hz (@ -3 dB)

Optical Specification - M80 or W150 Imaging Colorimeter + optional Spectroradiometer

Luminance Accuracy

±1 %

±1 %

Luminance Repeatability

0.002

0.002

Color Accuracy

±0.0015 in CIE 1931 x,y

±0.0015 in CIE 1931 x,y

Color Repeatability

0.0005 in CIE 1931 x,y

0.0005 in CIE 1931 x,y

Wavelength Range (nm)

400 to 780

400 to 780

Wavelength Data Increment (nm)

1nm (with spectrometer)

1nm (with spectrometer)

Wavelength Reproducibility

±1 nm (with spectrometer)

±1 nm (with spectrometer)

Polarization Sensitivity

< 3 %

< 3 %

Software Measurement Capabilities

- Center Color & Luminance
- Field of View
- Luminance Uniformity
- Color Uniformity
- Michelson Contrast & Uniformity
- Image Geometric Distortion
- Checkerboard & ANSI Contrast
- Sequential Contrast

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E-mail
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031-436-1420
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